Kun-Han Tsai, Srinivasan Gopalakrishnan. Test Coverage Analysis for Designs with Timing Exceptions. In 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017. pages 169-174, IEEE Computer Society, 2017. [doi]
@inproceedings{TsaiG17-0,
title = {Test Coverage Analysis for Designs with Timing Exceptions},
author = {Kun-Han Tsai and Srinivasan Gopalakrishnan},
year = {2017},
doi = {10.1109/ATS.2017.41},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2017.41},
researchr = {https://researchr.org/publication/TsaiG17-0},
cites = {0},
citedby = {0},
pages = {169-174},
booktitle = {26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-2437-1},
}