Kun-Han Tsai, Yu Huang 0005, Wu-Tung Cheng, Ting-Pu Tai, Augusli Kifli. Test cycle power optimization for scan-based designs. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 134-143, IEEE, 2010. [doi]
@inproceedings{TsaiHCTK10,
title = {Test cycle power optimization for scan-based designs},
author = {Kun-Han Tsai and Yu Huang 0005 and Wu-Tung Cheng and Ting-Pu Tai and Augusli Kifli},
year = {2010},
doi = {10.1109/TEST.2010.5699213},
url = {http://dx.doi.org/10.1109/TEST.2010.5699213},
researchr = {https://researchr.org/publication/TsaiHCTK10},
cites = {0},
citedby = {0},
pages = {134-143},
booktitle = {2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010},
editor = {Ron Press and Erik H. Volkerink},
publisher = {IEEE},
isbn = {978-1-4244-7206-2},
}