Kun-Han Tsai, Yu Huang 0005, Wu-Tung Cheng, Ting-Pu Tai, Augusli Kifli. Test cycle power optimization for scan-based designs. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 134-143, IEEE, 2010. [doi]
Abstract is missing.