A new method to improve accuracy of parasitics extraction considering sub-wavelength lithography effects

Kuen-Yu Tsai, Wei-Jhih Hsieh, Yuan-Ching Lu, Bo-Sen Chang, Sheng-Wei Chien, Yi-Chang Lu. A new method to improve accuracy of parasitics extraction considering sub-wavelength lithography effects. In Proceedings of the 15th Asia South Pacific Design Automation Conference, ASP-DAC 2010, Taipei, Taiwan, January 18-21, 2010. pages 651-656, IEEE, 2010. [doi]

Abstract

Abstract is missing.