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Du-Ming Tsai, Chih-Chia Kuo. Defect detection in inhomogeneously textured sputtered surfaces using 3D Fourier image reconstruction. Mach. Vis. Appl., 18(6):383-400, 2007. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous texturesDu-Ming Tsai, Shin-Min Chao. ivc, 23(3):325-338, 2005. [doi] Wavelet-based defect detection in solar wafer images with inhomogeneous textureWei-Chen Li, Du-Ming Tsai. PR, 45(2):742-756, 2012. [doi]
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