Analysis and solution to overcome EOS failure induced by latchup test in a high-voltage integrated circuits - researchr publication authors

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Hui-Wen Tsai, Ming-Dou Ker, Yi-Sheng Liu, Ming-Nan Chuang. Analysis and solution to overcome EOS failure induced by latchup test in a high-voltage integrated circuits. In 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013, Hsinchu, Taiwan, April 22-24, 2013. pages 1-4, IEEE, 2013. [doi]

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