Chia-Heng Tsai, Chi-Chang Lai, Hao Chen, Min-Jer Wang. Novel Circuit Probing for Tiny Inductor. In IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020. pages 31-34, IEEE, 2020. [doi]
@inproceedings{TsaiLCW20,
title = {Novel Circuit Probing for Tiny Inductor},
author = {Chia-Heng Tsai and Chi-Chang Lai and Hao Chen and Min-Jer Wang},
year = {2020},
doi = {10.1109/ITC-Asia51099.2020.00017},
url = {https://doi.org/10.1109/ITC-Asia51099.2020.00017},
researchr = {https://researchr.org/publication/TsaiLCW20},
cites = {0},
citedby = {0},
pages = {31-34},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020},
publisher = {IEEE},
isbn = {978-1-7281-8944-4},
}