Chia-Heng Tsai, Chi-Chang Lai, Hao Chen, Min-Jer Wang. Novel Circuit Probing for Tiny Inductor. In IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020. pages 31-34, IEEE, 2020. [doi]
No references recorded for this publication.
No citations of this publication recorded.