Yun-Chih Tsai, Tai-Hung Li, Tai-Chen Chen, Chung-Wei Yeh. Electromigration- and obstacle-avoiding routing tree construction. In 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013, Hsinchu, Taiwan, April 22-24, 2013. pages 1-4, IEEE, 2013. [doi]
Abstract is missing.