Jiun-Cheng Tsai, Aaron C.-W. Liang, Charles H.-P. Wen. Timing-Critical Path Analysis in Circuit Designs Considering Aging with Signal Probability. In IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022. pages 37-42, IEEE, 2022. [doi]
@inproceedings{TsaiLW22-1,
title = {Timing-Critical Path Analysis in Circuit Designs Considering Aging with Signal Probability},
author = {Jiun-Cheng Tsai and Aaron C.-W. Liang and Charles H.-P. Wen},
year = {2022},
doi = {10.1109/ITCAsia55616.2022.00017},
url = {https://doi.org/10.1109/ITCAsia55616.2022.00017},
researchr = {https://researchr.org/publication/TsaiLW22-1},
cites = {0},
citedby = {0},
pages = {37-42},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022},
publisher = {IEEE},
isbn = {978-1-6654-5523-7},
}