Jiun-Cheng Tsai, Aaron C.-W. Liang, Charles H.-P. Wen. Timing-Critical Path Analysis in Circuit Designs Considering Aging with Signal Probability. In IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022. pages 37-42, IEEE, 2022. [doi]
Abstract is missing.