SRAM stability characterization using tunable ring oscillators in 45nm CMOS - researchr publication authors

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Jason Tsai, Seng Oon Toh, Zheng Guo, Liang-Teck Pang, Tsu-Jae King Liu, Borivoje Nikolic. SRAM stability characterization using tunable ring oscillators in 45nm CMOS. In IEEE International Solid-State Circuits Conference, ISSCC 2010, Digest of Technical Papers, San Francisco, CA, USA, 7-11 February, 2010. pages 354-355, IEEE, 2010. [doi]

This author has not been identified. Look up 'Jason Tsai' in GoogleThis author has not been identified. Look up 'Seng Oon Toh' in GoogleThis author has not been identified. Look up 'Zheng Guo' in GoogleThis author has not been identified. Look up 'Liang-Teck Pang' in GoogleThis author has not been identified. Look up 'Tsu-Jae King Liu' in GoogleThis author has not been identified. Look up 'Borivoje Nikolic' in Google

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