SRAM stability characterization using tunable ring oscillators in 45nm CMOS

Jason Tsai, Seng Oon Toh, Zheng Guo, Liang-Teck Pang, Tsu-Jae King Liu, Borivoje Nikolic. SRAM stability characterization using tunable ring oscillators in 45nm CMOS. In IEEE International Solid-State Circuits Conference, ISSCC 2010, Digest of Technical Papers, San Francisco, CA, USA, 7-11 February, 2010. pages 354-355, IEEE, 2010. [doi]

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