SRAM stability characterization using tunable ring oscillators in 45nm CMOS

Jason Tsai, Seng Oon Toh, Zheng Guo, Liang-Teck Pang, Tsu-Jae King Liu, Borivoje Nikolic. SRAM stability characterization using tunable ring oscillators in 45nm CMOS. In IEEE International Solid-State Circuits Conference, ISSCC 2010, Digest of Technical Papers, San Francisco, CA, USA, 7-11 February, 2010. pages 354-355, IEEE, 2010. [doi]

@inproceedings{TsaiTGPLN10,
  title = {SRAM stability characterization using tunable ring oscillators in 45nm CMOS},
  author = {Jason Tsai and Seng Oon Toh and Zheng Guo and Liang-Teck Pang and Tsu-Jae King Liu and Borivoje Nikolic},
  year = {2010},
  doi = {10.1109/ISSCC.2010.5433820},
  url = {http://dx.doi.org/10.1109/ISSCC.2010.5433820},
  researchr = {https://researchr.org/publication/TsaiTGPLN10},
  cites = {0},
  citedby = {0},
  pages = {354-355},
  booktitle = {IEEE International Solid-State Circuits Conference, ISSCC 2010, Digest of Technical Papers, San Francisco, CA, USA, 7-11 February, 2010},
  publisher = {IEEE},
  isbn = {978-1-4244-6033-5},
}