STAR-ATPG: a high speed test pattern generator for large scan designs - researchr publication authors

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Kuo-Hui Tsai, Tompson, Janusz Rajski, Malgorzata Marek-Sadowska. STAR-ATPG: a high speed test pattern generator for large scan designs. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 1021-1030, IEEE Computer Society, 1999.

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