Kuo-Hui Tsai, Tompson, Janusz Rajski, Malgorzata Marek-Sadowska. STAR-ATPG: a high speed test pattern generator for large scan designs. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 1021-1030, IEEE Computer Society, 1999.
Abstract is missing.