Kuen-Yu Tsai, Meng-Fu You, Yi-Chang Lu, Philip C. W. Ng. A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects. In Sani R. Nassif, Jaijeet S. Roychowdhury, editors, 2008 International Conference on Computer-Aided Design (ICCAD 08), November 10-13, 2008, San Jose, CA, USA. pages 286-291, IEEE, 2008. [doi]
Abstract is missing.