Fong-Jyun Tsai, Chong-Siao Ye, Kuen-Jong Lee, Shi-Xuan Zheng, Yu Huang 0005, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang, Justyna Zawada. Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-10, IEEE, 2020. [doi]
Abstract is missing.