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Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process

Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen. Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process. In 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016. pages 121-125, IEEE, 2016. [doi]

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Konstantin Tscherkaschin

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Theodor Hillebrand

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Maike Taddiken

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Steffen Paul

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Dagmar Peters-Drolshagen

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