Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen. Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process. In 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016. pages 121-125, IEEE, 2016. [doi]
@inproceedings{TscherkaschinHT16-0,
title = {Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process},
author = {Konstantin Tscherkaschin and Theodor Hillebrand and Maike Taddiken and Steffen Paul and Dagmar Peters-Drolshagen},
year = {2016},
doi = {10.1109/IOLTS.2016.7604683},
url = {http://dx.doi.org/10.1109/IOLTS.2016.7604683},
researchr = {https://researchr.org/publication/TscherkaschinHT16-0},
cites = {0},
citedby = {0},
pages = {121-125},
booktitle = {22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016},
publisher = {IEEE},
isbn = {978-1-5090-1507-8},
}