Testable Design and Testing of MCMs Based on Multifrequency Scan

Wang-Dauh Tseng, Kuochen Wang. Testable Design and Testing of MCMs Based on Multifrequency Scan. In 5th Asian Test Symposium (ATS 96), November 20-22, 1996, Hsinchu, Taiwan. pages 75, IEEE Computer Society, 1996. [doi]

Abstract

Abstract is missing.