Tsu-Wei Tseng, Chun-Hsien Wu, Yu-Jen Huang, Jin-Fu Li, Alex Pao, Kevin Chiu, Eliot Chen. A Built-In Self-Repair Scheme for Multiport RAMs. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 355-360, IEEE Computer Society, 2007. [doi]
@inproceedings{TsengWHLPCC07,
title = {A Built-In Self-Repair Scheme for Multiport RAMs},
author = {Tsu-Wei Tseng and Chun-Hsien Wu and Yu-Jen Huang and Jin-Fu Li and Alex Pao and Kevin Chiu and Eliot Chen},
year = {2007},
doi = {10.1109/VTS.2007.4},
url = {http://dx.doi.org/10.1109/VTS.2007.4},
researchr = {https://researchr.org/publication/TsengWHLPCC07},
cites = {0},
citedby = {0},
pages = {355-360},
booktitle = {25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA},
publisher = {IEEE Computer Society},
}