Tsu-Wei Tseng, Chun-Hsien Wu, Yu-Jen Huang, Jin-Fu Li, Alex Pao, Kevin Chiu, Eliot Chen. A Built-In Self-Repair Scheme for Multiport RAMs. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 355-360, IEEE Computer Society, 2007. [doi]
Abstract is missing.