Pelopidas Tsoumanis, Georgios Ioannis Paliaroutis, Nestoras E. Evmorfopoulos, George I. Stamoulis. On the Impact of Electrical Masking and Timing Analysis on Soft Error Rate Estimation in Deep Submicron Technologies. In Luigi Dilillo, Luca Cassano, Athanasios Papadimitriou, editors, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.