Frank F. Tsui. The Cost and Speed Barriers in LSI/VLSI Testing : Can They Be Overcome By Testability Design ?. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 892-906, IEEE Computer Society, 1985.
@inproceedings{Tsui85,
title = {The Cost and Speed Barriers in LSI/VLSI Testing : Can They Be Overcome By Testability Design ?},
author = {Frank F. Tsui},
year = {1985},
tags = {testing, design},
researchr = {https://researchr.org/publication/Tsui85},
cites = {0},
citedby = {0},
pages = {892-906},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985},
publisher = {IEEE Computer Society},
}