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The Cost and Speed Barriers in LSI/VLSI Testing : Can They Be Overcome By Testability Design ?

Frank F. Tsui. The Cost and Speed Barriers in LSI/VLSI Testing : Can They Be Overcome By Testability Design ?. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 892-906, IEEE Computer Society, 1985.

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