Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability

Yasumasa Tsukamoto, Koji Nii, Susumu Imaoka, Yuji Oda, Shigeki Ohbayashi, Tomoaki Yoshizawa, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara. Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability. In 2005 International Conference on Computer-Aided Design (ICCAD 05), November 6-10, 2005, San Jose, CA, USA. pages 398-405, IEEE Computer Society, 2005.

Abstract

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