Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsuhiro Suma, Kazuyasu Fujishima. Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters. IEEE Design & Test of Computers, 10(2):6-12, 1993. [doi]
Abstract is missing.