Reliable Threshold Voltage Determination for Sub-0.1µm Gate Length MOSFET s

Morikazu Tsuno, Masato Suga, Masayasu Tanaka, Kentaro Shibahara, Michiko Miura-Mattausch, Masataka Hirose. Reliable Threshold Voltage Determination for Sub-0.1µm Gate Length MOSFET s. In ASP-DAC. pages 111-116, 1998.

Abstract

Abstract is missing.