RLC effects on worst-case switching pattern for on-chip buses

Shang-Wei Tu, Jing-Yang Jou, Yao-Wen Chang. RLC effects on worst-case switching pattern for on-chip buses. In ISCAS (4). pages 945-948, 2004.

Authors

Shang-Wei Tu

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Jing-Yang Jou

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Yao-Wen Chang

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