RLC effects on worst-case switching pattern for on-chip buses

Shang-Wei Tu, Jing-Yang Jou, Yao-Wen Chang. RLC effects on worst-case switching pattern for on-chip buses. In ISCAS (4). pages 945-948, 2004.

@inproceedings{TuJC04:0,
  title = {RLC effects on worst-case switching pattern for on-chip buses},
  author = {Shang-Wei Tu and Jing-Yang Jou and Yao-Wen Chang},
  year = {2004},
  researchr = {https://researchr.org/publication/TuJC04%3A0},
  cites = {0},
  citedby = {0},
  pages = {945-948},
  booktitle = {ISCAS (4)},
}