Shang-Wei Tu, Jing-Yang Jou, Yao-Wen Chang. RLC effects on worst-case switching pattern for on-chip buses. In ISCAS (4). pages 945-948, 2004.
@inproceedings{TuJC04:0, title = {RLC effects on worst-case switching pattern for on-chip buses}, author = {Shang-Wei Tu and Jing-Yang Jou and Yao-Wen Chang}, year = {2004}, researchr = {https://researchr.org/publication/TuJC04%3A0}, cites = {0}, citedby = {0}, pages = {945-948}, booktitle = {ISCAS (4)}, }