Tugkan Tuglular, Mutlu Beyazit, Dilek Öztürk. Featured Event Sequence Graphs for Model-Based Incremental Testing of Software Product Lines. In Vladimir Getov, Jean-Luc Gaudiot, Nariyoshi Yamai, Stelvio Cimato, J. Morris Chang, Yuuichi Teranishi, Ji-Jiang Yang, Hong Va Leong, Hossain Shahriar, Michiharu Takemoto, Dave Towey, Hiroki Takakura, Atilla Elçi, Susumu Takeuchi, Satish Puri, editors, 43rd IEEE Annual Computer Software and Applications Conference, COMPSAC 2019, Milwaukee, WI, USA, July 15-19, 2019, Volume 1. pages 197-202, IEEE, 2019. [doi]
Abstract is missing.