Rodham E. Tulloss. IEEE 1149 Standards - Changing Testing, Silicon to Systems. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 399-408, IEEE Computer Society, 1993.
@inproceedings{Tulloss93,
title = {IEEE 1149 Standards - Changing Testing, Silicon to Systems},
author = {Rodham E. Tulloss},
year = {1993},
tags = {testing, e-science},
researchr = {https://researchr.org/publication/Tulloss93},
cites = {0},
citedby = {0},
pages = {399-408},
booktitle = {Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993},
publisher = {IEEE Computer Society},
isbn = {0-7803-1430-1},
}