IEEE 1149 Standards - Changing Testing, Silicon to Systems - researchr publication

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Rodham E. Tulloss. IEEE 1149 Standards - Changing Testing, Silicon to Systems. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 399-408, IEEE Computer Society, 1993.

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