At-Speed Testing of Core-Based System-on-Chip Using an Embedded Micro-Tester

Matthieu Tuna, Mounir Benabdenbi, Alain Greiner. At-Speed Testing of Core-Based System-on-Chip Using an Embedded Micro-Tester. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 447-454, IEEE Computer Society, 2007. [doi]

Authors

Matthieu Tuna

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Mounir Benabdenbi

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Alain Greiner

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