Matthieu Tuna, Mounir Benabdenbi, Alain Greiner. At-Speed Testing of Core-Based System-on-Chip Using an Embedded Micro-Tester. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 447-454, IEEE Computer Society, 2007. [doi]
@inproceedings{TunaBG07,
title = {At-Speed Testing of Core-Based System-on-Chip Using an Embedded Micro-Tester},
author = {Matthieu Tuna and Mounir Benabdenbi and Alain Greiner},
year = {2007},
doi = {10.1109/VTS.2007.16},
url = {http://dx.doi.org/10.1109/VTS.2007.16},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/TunaBG07},
cites = {0},
citedby = {0},
pages = {447-454},
booktitle = {25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA},
publisher = {IEEE Computer Society},
}