Onur Tunali, Mustafa Alton. Defect tolerance in diode, FET, and four-terminal switch based nano-crossbar arrays. In Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2015, Boston, MA, USA, July 8-10, 2015. pages 82-87, IEEE, 2015. [doi]
Abstract is missing.