Ritesh P. Turakhia, Mark Ward, Sandeep Kumar Goel, Brady Benware. Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 167-172, IEEE Computer Society, 2009. [doi]
@inproceedings{TurakhiaWGB09,
title = {Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study},
author = {Ritesh P. Turakhia and Mark Ward and Sandeep Kumar Goel and Brady Benware},
year = {2009},
doi = {10.1109/VTS.2009.37},
url = {http://dx.doi.org/10.1109/VTS.2009.37},
tags = {case study, analysis, diagnostics},
researchr = {https://researchr.org/publication/TurakhiaWGB09},
cites = {0},
citedby = {0},
pages = {167-172},
booktitle = {27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3598-2},
}