Ritesh P. Turakhia, Mark Ward, Sandeep Kumar Goel, Brady Benware. Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 167-172, IEEE Computer Society, 2009. [doi]
Abstract is missing.