Vittorio Turco, L. Fezza, Annachiara Ruospo, E. Sanchez, Matteo Sonza Reorda. APSS Metrics for Fault Detection: Area, Position, Symmetry, and Shape in Image Segmentation. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2025, Barcelona, Spain, October 21-23, 2025. pages 1-6, IEEE, 2025. [doi]
Abstract is missing.