V. Turco, Annachiara Ruospo, Gabriele Gavarini, Ernesto Sánchez 0001, Matteo Sonza Reorda. Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries. In Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.