Matthew J. Turnquist, Erkka Laulainen, Jani Mäkipää, Lauri Koskinen. Measurement of a system-adaptive error-detection sequential circuit with subthreshold SCL. In 2011 NORCHIP, Lund, Sweden, November 14-15, 2011. pages 1-4, IEEE, 2011. [doi]
@inproceedings{TurnquistLMK11,
title = {Measurement of a system-adaptive error-detection sequential circuit with subthreshold SCL},
author = {Matthew J. Turnquist and Erkka Laulainen and Jani Mäkipää and Lauri Koskinen},
year = {2011},
doi = {10.1109/NORCHP.2011.6126746},
url = {http://dx.doi.org/10.1109/NORCHP.2011.6126746},
researchr = {https://researchr.org/publication/TurnquistLMK11},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2011 NORCHIP, Lund, Sweden, November 14-15, 2011},
publisher = {IEEE},
isbn = {978-1-4577-0514-4},
}