Matthew J. Turnquist, Erkka Laulainen, Jani Mäkipää, Lauri Koskinen. Measurement of a system-adaptive error-detection sequential circuit with subthreshold SCL. In 2011 NORCHIP, Lund, Sweden, November 14-15, 2011. pages 1-4, IEEE, 2011. [doi]
Abstract is missing.