QC-Fill: An X-Fill method for quick-and-cool scan test

Chao-Wen Tzeng, Shi-Yu Huang. QC-Fill: An X-Fill method for quick-and-cool scan test. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 1142-1147, IEEE, 2009. [doi]

Authors

Chao-Wen Tzeng

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Shi-Yu Huang

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