Chao-Wen Tzeng, Shi-Yu Huang. QC-Fill: An X-Fill method for quick-and-cool scan test. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 1142-1147, IEEE, 2009. [doi]
@inproceedings{TzengH09-0,
title = {QC-Fill: An X-Fill method for quick-and-cool scan test},
author = {Chao-Wen Tzeng and Shi-Yu Huang},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5090609&arnumber=5090835&count=326&index=221},
tags = {testing},
researchr = {https://researchr.org/publication/TzengH09-0},
cites = {0},
citedby = {0},
pages = {1142-1147},
booktitle = {Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009},
publisher = {IEEE},
}