Raimund Ubar, Sergei Devadze, Maksim Jenihhin, Jaan Raik, Gert Jervan, Peeter Ellervee. Hierarchical Calculation of Malicious Faults for Evaluating the Fault-Tolerance. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 222-227, IEEE Computer Society, 2008. [doi]
Abstract is missing.