Raimund Ubar, Lembit Jürimägi, Adeniyi Olanrewaju Adekoya, Maksim Jenihhin. True Path Tracing in Structurally Synthesized BDDs for Testability Analysis of Digital Circuits. In 22nd Euromicro Conference on Digital System Design, DSD 2019, Kallithea, Greece, August 28-30, 2019. pages 492-499, IEEE, 2019. [doi]
Abstract is missing.