Raimund Ubar, Lembit Jürimägi, Elmet Orasson, Jaan Raik. Fault Collapsing in Digital Circuits Using Fast Fault Dominance and Equivalence Analysis with SSBDDs. In Youngsoo Shin, Chi-Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis, editors, VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers. Volume 483 of IFIP Advances in Information and Communication Technology, pages 23-45, Springer, 2015. [doi]
Abstract is missing.