Aniruddha N. Udipi, Naveen Muralimanohar, Rajeev Balasubramonian, Al Davis, Norman P. Jouppi. LOT-ECC: Localized and tiered reliability mechanisms for commodity memory systems. In 39th International Symposium on Computer Architecture (ISCA 2012), June 9-13, 2012, Portland, OR, USA. pages 285-296, IEEE, 2012. [doi]
Abstract is missing.