Motoo Ueda, Shinichi Ishikawa, Masaru Goishi, Satoru Kitagawa, Hiroshi Araki, Shuichi Inage. Automated system level functional test program generation on ATE from EDA using Functional Test Abstraction. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-7, IEEE Computer Society, 2012. [doi]
@inproceedings{UedaIGKAI12,
title = {Automated system level functional test program generation on ATE from EDA using Functional Test Abstraction},
author = {Motoo Ueda and Shinichi Ishikawa and Masaru Goishi and Satoru Kitagawa and Hiroshi Araki and Shuichi Inage},
year = {2012},
doi = {10.1109/TEST.2012.6401590},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2012.6401590},
researchr = {https://researchr.org/publication/UedaIGKAI12},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-1594-4},
}